Description: The NC-AFM 2005 is the premier event for research on higest resolution force controlled imaging, spectroscopy and manipulation. The conference provides a forum for non-contact force microscopy.
Keywords: non-contact, dynamic, force, microscopy, AFM, SFM, imaging, spectroscopy, manipulation, theory, conference, insulating, surface, nanostructure, Bad, Essen, Universit�t Osnabr�ck, Michael Reichling,
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2024年12月26日